CLF scientist Charlotte Sanders was involved in a study, alongside collaborators from Aarhus University, Carnegie Mellon University, National Institute for Materials Science, and Diamond, to use angle-resolved photoemission spectroscopy (ARPES) to study the electronic properties of current-carrying devices.
The key technological advance highlighted in the paper was the use of a small light spot to spatially map the ARPES spectra across different regions of an operating device. Using ARPES, the group was able to correlate the presence of structural defects with reduced carrier lifetimes and mobilities. The devices were mounted for measurement in commercially available chip carriers.
The study shows that ARPES can generate a wealth of information about in-operando, current-carrying devices. Charlotte, who worked on Diamond’s beamline for the experiment added, “This type of work dovetails nicely with what we do at Artemis: both the new work at Diamond and our usual work at Artemis concern out-of-equilibrium conditions in solid-state materials. The measurements at Diamond probe steady-state out-of-equilibrium conditions, while at Artemis we look at 'kicked’ out-of-equilibrium conditions as they decay to equilibrium or to long-lived metastable states.”
Read more about it here.