• Customised commercial endstation for material science to offer measurements in (x,y,kx,ky,kz,EB,t)
• 3 analysers:• SPECS Astraois hemisphere
• FeSuMa Fermi-surface mapper
• SPECS Metis momentum microscope
• Cryogen-free cooling for measurement down to 25 K
• In-situ sample preparation/storage including sputtering and exfoliation
• In-situ surface characterisation techniques
• Low-energy
electron diffraction (LEED)
• X-ray
photoelectron spectroscopy (XPS)
• Sample surface mapping (<20 µm) capability.
