- EUV
Ptychography Endstation for
high-resolution, lensless
imaging at 40–90 eV photon energies.
- High-resolution
label-free imaging of cells and organelles, with phase contrasts based on
density and composition.
- Nano-scale
materials characterization: 2D/3D imaging of morphology,
strain, and defects.
- Thin-film
metrology:
imaging buried layers and interfaces.
- Imaging
in the water window (future plan).
